Difference between revisions of "Energy dispersive x-ray analysis"

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[[Category:Materials database]]

Latest revision as of 10:26, 19 February 2014

Description

Energy dispersive X-ray microanalysis (EDX) can be used to determine which elements are present in a sample. A scanning electron microscope (SEM) is usually used in EDX. An electron beam falls on the sample generating a small amount of X-rays. The X-rays can identify the various elements which are present in the sample. EDX can show whether a sample contains, for example, chemical elements such as lead, copper, arsenic, tin, antimony, cobalt and chromium. However, this is not sufficient to show which molecular or crystalline forms have been used. EDX must be used in conjunction with other examination or molecular analysis in order to find out which chemical compounds are present.


Synonyms and related terms

EDAX; EDS; EDXA; microanalyse X par dispersion d'énergie (Fr.)

Additional information

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