Difference between revisions of "File:3 02 3 Orpiment1916 EDS Spectrum.jpg"

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Elements Identified
 
Elements Identified
 +
Major (> 10%): oxygen, carbon, arsenic.
 +
Minor (1-10%): sulfer, silicon, calcium.
 +
Trace (< 1%):NA.
  
−
Major (> 10%): oxygen, carbon, arsenic
+
Area X-ray counts collected:1,007,569
−
 
+
Live Time:12.2s
−
Minor (1-10%): sulfer, silicon, calcium
+
Magnification:502x
−
 
 
−
Trace (< 1%):NA
 
−
 
 
 
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
 
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

Revision as of 13:41, 29 June 2017

EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)

Elements Identified Major (> 10%): oxygen, carbon, arsenic. Minor (1-10%): sulfer, silicon, calcium. Trace (< 1%):NA.

Area X-ray counts collected:1,007,569 Live Time:12.2s Magnification:502x Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

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