Difference between revisions of "File:3 02 3 Orpiment1916 SEM 100um.jpg"

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SEM image with 100µm measurement bar (approximate to 600x magnification) (LC)  
 
SEM image with 100µm measurement bar (approximate to 600x magnification) (LC)  
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Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascals) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 12.5kV
 
Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascals) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 12.5kV

Latest revision as of 13:28, 29 June 2017

SEM image with 100µm measurement bar (approximate to 600x magnification) (LC)

Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascals) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 12.5kV

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current13:21, 29 June 2017Thumbnail for version as of 13:21, 29 June 20171,024 × 943 (264 KB)AJones (talk | contribs)File uploaded with MsUpload
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