Difference between revisions of "File:3 02 5 OrpimentCoarse EDS Spectrum.jpg"
(AJones uploaded a new version of "3 02 5 OrpimentCoarse EDS Spectrum.jpg": File uploaded with MsUpload) |
(AJones uploaded a new version of "3 02 5 OrpimentCoarse EDS Spectrum.jpg": File uploaded with MsUpload) |
(No difference)
| |
Latest revision as of 15:49, 29 June 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): arsenic, oxygen, carbon. Minor (1-10%): nitrogen, sulfur. Trace (< 1%): tin, silicon, aluminum.
Area X-ray counts collected: 1,005,413. Live Time: 7.9 seconds. Magnification: 780x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
File history
Click on a date/time to view the file as it appeared at that time.
| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 15:49, 29 June 2017 |  | 1,688 × 442 (73 KB) | AJones (talk | contribs) | File uploaded with MsUpload |
| 15:26, 29 June 2017 |  | 1,688 × 442 (73 KB) | AJones (talk | contribs) | File uploaded with MsUpload | |
| 13:48, 29 June 2017 |  | 1,688 × 442 (73 KB) | AJones (talk | contribs) | File uploaded with MsUpload |
You cannot overwrite this file.
File usage
The following page uses this file:
