Difference between revisions of "File:3 03 10 TerraSienna SEM 50um.jpg"

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SEM image with 50µm measurement bar (approximate to 1000x magnification) (LC)  
 
SEM image with 50µm measurement bar (approximate to 1000x magnification) (LC)  
  
Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascals) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 12.5kV
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Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascals) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 15kV

Latest revision as of 15:59, 29 June 2017

SEM image with 50µm measurement bar (approximate to 1000x magnification) (LC)

Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascals) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 15kV

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