Difference between revisions of "File:3 06 11 NaplesYellow EDS Spectrum.jpg"
(File uploaded with MsUpload) |
|||
Line 1: | Line 1: | ||
− | + | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) | |
+ | |||
+ | Elements Identified | ||
+ | Major (> 10%): carbon, lead, tin, oxygen. | ||
+ | Minor (1-10%): zinc, sodium. | ||
+ | Trace (< 1%): silicon. | ||
+ | |||
+ | Area X-ray counts collected: 1,009,493. | ||
+ | Live Time: 10.8 seconds. | ||
+ | Magnification: 2725x. | ||
+ | Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. |
Latest revision as of 08:14, 7 July 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): carbon, lead, tin, oxygen. Minor (1-10%): zinc, sodium. Trace (< 1%): silicon.
Area X-ray counts collected: 1,009,493. Live Time: 10.8 seconds. Magnification: 2725x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
File history
Click on a date/time to view the file as it appeared at that time.
Date/Time | Thumbnail | Dimensions | User | Comment | |
---|---|---|---|---|---|
current | 08:08, 7 July 2017 | 1,688 × 442 (85 KB) | AJones (talk | contribs) | File uploaded with MsUpload |
You cannot overwrite this file.
File usage
The following page uses this file: