Difference between revisions of "File:3 12 9 MarsYellow EDS Spectrum.jpg"

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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
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Elements Identified
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Major (> 10%): oxygen, carbon, iron.
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Minor (1-10%): silicon, aluminum, calcium.
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Trace (< 1%): arsenic, manganese, potassium.
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Area X-ray counts collected: 1,013,894.
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Live Time: 30.6 seconds.
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Magnification: 2762x.
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Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

Latest revision as of 17:45, 15 August 2017

EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)

Elements Identified Major (> 10%): oxygen, carbon, iron. Minor (1-10%): silicon, aluminum, calcium. Trace (< 1%): arsenic, manganese, potassium.

Area X-ray counts collected: 1,013,894. Live Time: 30.6 seconds. Magnification: 2762x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

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