Difference between revisions of "File:ChartImageLarge 2469.jpg"
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| − | + | SEM at 600x (MFA) | |
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| + | Analyzed on JEOL JSM 6460LV scanning electron microscope with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV with SEM chamber pressure of 35 Pascals. Images were collected using JEOL backscattered electron imaging in shadow mode. | ||
Latest revision as of 10:33, 4 May 2013
SEM at 600x (MFA)
Analyzed on JEOL JSM 6460LV scanning electron microscope with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV with SEM chamber pressure of 35 Pascals. Images were collected using JEOL backscattered electron imaging in shadow mode.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
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| current | 10:28, 4 May 2013 |  | 480 × 480 (68 KB) | Maintenance script (talk) | Importing image file |
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