Difference between revisions of "Scanning electron microscope"

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== Authority ==
 
== Authority ==
  
* M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747  
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* M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747
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*  http://www.nationalgallery.org.uk/paintings/glossary/scanning-electron-microscope/*/chooseLetter/S
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*  http://www.nga.gov/resources/scienceresearch/glossary.shtm
  
  
 
[[Category:Materials database]]
 
[[Category:Materials database]]

Revision as of 10:40, 19 February 2014

File:SEM.jpg
JEOL scanning electron microscope system

Description

A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present.

Synonyms and Related Terms

SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.)

Authority

  • M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747

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