Difference between revisions of "X-ray fluorescence (XRF) spectroscopy"
(username removed) |
(username removed) |
||
| Line 5: | Line 5: | ||
== Synonyms and Related Terms == | == Synonyms and Related Terms == | ||
| − | XRF; analyse par fluorescence X (Fr.); spettrofotometria XRF (It.); | + | XRF; analyse par fluorescence X (Fr.); spettrofotometria XRF (It.); Röntgenfluoreszenzanalyse (RFA) (Deut.); Röntgenfluoreszenzspektroskopie (RFS) (Deut.); röntgenfluorescentiespectrometrie (Ned.); análise por fluorescência de raios X (Port.) |
== Additional Information == | == Additional Information == | ||
| Line 13: | Line 13: | ||
== Authority == | == Authority == | ||
| − | * | + | * Walter C. McCrone, John Gustave Delly, ''The Particle Atlas'', W. McCrone Associates, Chicago, IV, 1972 |
* ''Ancient Egyptian Materials and Technologies'', Paul Nicholson, Ian Shaw (eds.), Cambridge University Press, Cambridge, 2000 Comment: B.Aston, J.Harrell, I.Shaw, "Stone" and P.Nicholson, J.Henderson, "Glass" | * ''Ancient Egyptian Materials and Technologies'', Paul Nicholson, Ian Shaw (eds.), Cambridge University Press, Cambridge, 2000 Comment: B.Aston, J.Harrell, I.Shaw, "Stone" and P.Nicholson, J.Henderson, "Glass" | ||
| Line 19: | Line 19: | ||
* Wikipedia, the free encyclopedia, at http://www.wikipedia.com Comment: http://en.wikipedia.org/wiki/X-ray_fluorescence | * Wikipedia, the free encyclopedia, at http://www.wikipedia.com Comment: http://en.wikipedia.org/wiki/X-ray_fluorescence | ||
| − | * | + | * Richard S. Lewis, ''Hawley's Condensed Chemical Dictionary'', Van Nostrand Reinhold, New York, 10th ed., 1993 |
* Art and Architecture Thesaurus Online, http://www.getty.edu/research/tools/vocabulary/aat/, J. Paul Getty Trust, Los Angeles, 2000 | * Art and Architecture Thesaurus Online, http://www.getty.edu/research/tools/vocabulary/aat/, J. Paul Getty Trust, Los Angeles, 2000 | ||
Revision as of 07:52, 24 July 2013
Description
An nondestructive analytical method used to qualitatively and semi-quantitatively determine the elemental content of materials. The x-ray spectrum emitted from each element has a unique set of energies that are related to the type and amount of atoms present in the sample. Detections limits vary depending on instrument, elements, and sample matrix. The instrument source is an x-ray tube for x-ray fluorescence; a similar x-ray spectrum is generated by the emission of x-rays using an electron beam as a source in a scanning electron microscope (SEM). Typically, for an instrument in air, calcium is the lowest atomic number element measured; when air is evacuated, such as in a SEM, the lowest detectable element is carbon.
Synonyms and Related Terms
XRF; analyse par fluorescence X (Fr.); spettrofotometria XRF (It.); Röntgenfluoreszenzanalyse (RFA) (Deut.); Röntgenfluoreszenzspektroskopie (RFS) (Deut.); röntgenfluorescentiespectrometrie (Ned.); análise por fluorescência de raios X (Port.)
Additional Information
Lisha D. Glinsman, The Application of X-Ray Fluorescence Spectrometry to the Study of Museum Objects, Doctoral Thesis, University of Amsterdam, 2004.
Authority
- Walter C. McCrone, John Gustave Delly, The Particle Atlas, W. McCrone Associates, Chicago, IV, 1972
- Ancient Egyptian Materials and Technologies, Paul Nicholson, Ian Shaw (eds.), Cambridge University Press, Cambridge, 2000 Comment: B.Aston, J.Harrell, I.Shaw, "Stone" and P.Nicholson, J.Henderson, "Glass"
- Wikipedia, the free encyclopedia, at http://www.wikipedia.com Comment: http://en.wikipedia.org/wiki/X-ray_fluorescence
- Richard S. Lewis, Hawley's Condensed Chemical Dictionary, Van Nostrand Reinhold, New York, 10th ed., 1993
- Art and Architecture Thesaurus Online, http://www.getty.edu/research/tools/vocabulary/aat/, J. Paul Getty Trust, Los Angeles, 2000