ChartImageLarge 2440.jpg
Jump to navigation
Jump to search
No higher resolution available.
ChartImageLarge_2440.jpg (480 × 480 pixels, file size: 58 KB, MIME type: image/jpeg)
SEM at 600x (MFA)
Analyzed on JEOL JSM 6460LV scanning electron microscope with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV with SEM chamber pressure of 35 Pascals. Images were collected using JEOL backscattered electron imaging in shadow mode.
File history
Click on a date/time to view the file as it appeared at that time.
| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 10:28, 4 May 2013 | | 480 × 480 (58 KB) | Maintenance script (talk) | Importing image file |
You cannot overwrite this file.
File usage
The following page uses this file:
