Search results

Page title matches

• Electron microscope
  [[File:SEM.jpg|thumb|JEOL scanning electron microscope system]] ...d from the surface of the sample. These electrons are detected and imaged. Electron microscopes can provide magnifications up to 100,000 x.
  1 KB (179 words) - 14:12, 1 August 2022
• Scanning electron microscope
  ...ially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysi SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut
  1 KB (166 words) - 12:35, 20 June 2023

Page text matches

• TEM
  #REDIRECT [[transmission electron microscope]]
  46 bytes (4 words) - 12:55, 5 October 2016
• Electron microprobe
  ...ope with wavelength disperse spectrometers (WDS). First developed in 1947, electron microprobes can quantitatively measure the elemental composition of micron electron probe microscope; electronprobe microanalysis; EPMA; WDS; Elektronen Mikroprobe (Deut.); mic
  847 bytes (97 words) - 11:12, 1 August 2022
• E-SEM
  See [[environmental scanning electron microscope]]
  102 bytes (9 words) - 11:04, 1 August 2022
• SEM
  An acronym for [[scanning electron microscope]].
  101 bytes (10 words) - 11:36, 28 June 2022
• Electron microscope
  [[File:SEM.jpg|thumb|JEOL scanning electron microscope system]] ...d from the surface of the sample. These electrons are detected and imaged. Electron microscopes can provide magnifications up to 100,000 x.
  1 KB (179 words) - 14:12, 1 August 2022
• Scanning electron microscope
  ...ially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysi SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut
  1 KB (166 words) - 12:35, 20 June 2023
• Electron diffraction
  ...on. First observed in 1927 by G.P.Thomson, L.H. Germer, and C.J. Davisson, electron diffraction is used to study the molecular structure of materials. When a d * ''Encyclopedia Britannica'', http://www.britannica.com Comment: "Electron Diffraction." Accessed 19 Aug. 2004 .
  1 KB (138 words) - 14:10, 1 August 2022
• Electron lens
  ...us and deflect the electron beam through the optical column in an electron microscope. An electromagnet consists of a coil of wire wrapped around a soft iron cor
  823 bytes (114 words) - 14:10, 1 August 2022
• Nanometer
  ...pically used to measure particles with an [[electron%20microscope|electron microscope]]. They are also used for measuring wavelengths of [[electromagnetic%20radi
  909 bytes (112 words) - 09:07, 19 October 2022
• Energy dispersive x-ray analysis
  A scanning electron microscope (SEM) is usually used in EDX. An electron beam falls on the sample generating a small amount of X-rays. The X-rays ca
  1 KB (172 words) - 10:54, 25 July 2022
• Microscope
  ...ree spectacle makers—Hans Jansen, his son Zacharias, and Hans Lippershey. Electron microscopes use a beam of electrons to form images of 1,000 to 1,000,000 ti * ''Encyclopedia Britannica'', http://www.britannica.com Comment: Microscope. Retrieved June 5, 2003.
  1 KB (187 words) - 15:03, 26 July 2022
• Resolving power
  ...can resolve details as small as 0.01 micrometer. The resolving power of a microscope is much more important than its magnification.
  1 KB (162 words) - 15:30, 4 October 2022
• X-ray fluorescence (XRF) spectroscopy
  ...ission of x-rays using an electron beam as a source in a scanning electron microscope (SEM); that detector is called Energy Dispersive Spectroscopy (EDS). Typic
  3 KB (430 words) - 16:18, 16 November 2023