1 01 14 FinePlasterersLime SEM 50um.jpg
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SEM image with 50µm measurement bar (approximate to 1000x magnification) (LC) Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascal) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 15 kV Image is compressed from an original 954 KB TIF file.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 08:24, 5 January 2017 | | 1,024 × 943 (524 KB) | MKullman (talk | contribs) | Reverted to version as of 14:18, 5 January 2017 |
| 08:22, 5 January 2017 |  | 1,024 × 943 (524 KB) | MKullman (talk | contribs) | ||
| 08:18, 5 January 2017 |  | 1,024 × 943 (524 KB) | MKullman (talk | contribs) | SEM image with 50µm measurement bar (approximate to 1000x magnification) (LC) Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum e... |
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