ChartImageLarge 2438.jpg
Revision as of 10:33, 4 May 2013 by (username removed)
ChartImageLarge_2438.jpg (640 × 201 pixels, file size: 19 KB, MIME type: image/jpeg)
EDS (MFA)
Analyzed on JEOL JSM 6460LV scanning electron microscope with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV with SEM chamber pressure of 35 Pascals. The resolution of the INCA detector is 133 eV at 5.9 keV.
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