1 05 9 FlakeWhiteRoberson EDS Spectrum.jpg
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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): lead, oxygen, carbon Minor (1-10%): NA Trace (< 1%): NA
Area X-ray counts collected: 1,010,552 Live Time: 23.8 seconds Magnification: 4805x Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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| current | 14:01, 5 January 2017 | | 1,460 × 441 (59 KB) | MKullman (talk | contribs) | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): lead, oxygen, carbon Minor (1-10%): NA Trace (< 1%): NA Area X-ray counts collected: 1,010,552 Live Time: 23.8 seconds Magnif... |
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