Difference between revisions of "File:2 03 5 NoirDeVigna EDS Spectrum.jpg"

From CAMEO
Jump to navigation Jump to search
(EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): carbon, oxygen, calcium. Minor (1-10%): phosphorus. Trace (< 1%): magnesium, sodium, silicon. Area X-ray counts collected: 1,...)
 
 
Line 6: Line 6:
 
Trace (< 1%): magnesium, sodium, silicon.
 
Trace (< 1%): magnesium, sodium, silicon.
  
Area X-ray counts collected: 1,052,590.
+
Area X-ray counts collected: 1,012,182.
Live Time: 49.4 seconds.
+
Live Time: 19.7 seconds.
Magnification: 500x.
+
Magnification: 743x.
 
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
 
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

Latest revision as of 14:25, 31 January 2017

EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)

Elements Identified Major (> 10%): carbon, oxygen, calcium. Minor (1-10%): phosphorus. Trace (< 1%): magnesium, sodium, silicon.

Area X-ray counts collected: 1,012,182. Live Time: 19.7 seconds. Magnification: 743x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

File history

Click on a date/time to view the file as it appeared at that time.

Date/TimeThumbnailDimensionsUserComment
current14:24, 31 January 2017Thumbnail for version as of 14:24, 31 January 20171,460 × 441 (70 KB)MKullman (talk | contribs)EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): carbon, oxygen, calcium. Minor (1-10%): phosphorus. Trace (< 1%): magnesium, sodium, silicon. Area X-ray counts collected: 1,...

The following page uses this file:

Metadata