Brochantite Raman MFA 385.TIF
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Analyzed using Bruker Senterra instrument with Opus 5.5 software. Gemstone was analyzed using 532 nm laser at a power setting of 10 over a wavelength range of 65-1555 cm-1 and resolution of 3-5 cm-1. The spectrum was integrated for 100 seconds. A 20x objective was used for an analysis area of approximately 2 microns.
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 13:40, 27 January 2020 | 960 × 720 (68 KB) | MDerrick (talk | contribs) | Analyzed using Bruker Senterra instrument with Opus 5.5 software. Gemstone was analyzed using 532 nm laser at a power setting of 10 over a wavelength range of 65-1555 cm-1 and resolution of 3-5 cm-1. The spectrum was integrated for 100 seconds. A 20... |
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