View source for File:3 03 25 NoName SEM 100um.jpg

SEM image with 100µm measurement bar (approximate to 600x magnification) (LC) 

Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascals) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 15kV