Difference between revisions of "Scanning electron microscope"
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== Description == | == Description == | ||
| − | A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample characterize the elements that are present. | + | A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present. |
== Synonyms and Related Terms == | == Synonyms and Related Terms == | ||
Revision as of 03:31, 6 February 2014
File:SEM.jpg
JEOL scanning electron microscope system
Description
A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present.
Synonyms and Related Terms
SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.)
Authority
- M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747