Difference between revisions of "File:3 02 3 Orpiment1916 EDS Spectrum.jpg"
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Elements Identified | Elements Identified | ||
| + | |||
Major (> 10%): oxygen, carbon, arsenic | Major (> 10%): oxygen, carbon, arsenic | ||
| + | |||
Minor (1-10%): sulfer, silicon, calcium | Minor (1-10%): sulfer, silicon, calcium | ||
| + | |||
Trace (< 1%):NA | Trace (< 1%):NA | ||
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. | Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. | ||
Revision as of 12:34, 29 June 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified
Major (> 10%): oxygen, carbon, arsenic
Minor (1-10%): sulfer, silicon, calcium
Trace (< 1%):NA
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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