Difference between revisions of "File:3 02 3 Orpiment1916 EDS Spectrum.jpg"

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Trace (< 1%):NA.
 
Trace (< 1%):NA.
  
−
Area X-ray counts collected:1,007,569
+
Area X-ray counts collected: 1,007,569.
−
Live Time:12.2s
+
Live Time: 12.2 seconds.
−
Magnification:502x
+
Magnification: 502x.
 
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
 
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

Latest revision as of 12:43, 29 June 2017

EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)

Elements Identified Major (> 10%): oxygen, carbon, arsenic. Minor (1-10%): sulfer, silicon, calcium. Trace (< 1%):NA.

Area X-ray counts collected: 1,007,569. Live Time: 12.2 seconds. Magnification: 502x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

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