Difference between revisions of "File:3 04 39 YellowOchre40000 EDS Spectrum.jpg"

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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
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Elements Identified
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Major (> 10%): oxygen, iron, carbon.
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Minor (1-10%): silicon, arsenic, aluminum, calcium.
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Trace (< 1%): barium, sulfur, potassium, chlorine.
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Area X-ray counts collected: 1,026,477.
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Live Time: 62.4 seconds.
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Magnification: 1032x.
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Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

Latest revision as of 14:41, 6 July 2017

EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)

Elements Identified Major (> 10%): oxygen, iron, carbon. Minor (1-10%): silicon, arsenic, aluminum, calcium. Trace (< 1%): barium, sulfur, potassium, chlorine.

Area X-ray counts collected: 1,026,477. Live Time: 62.4 seconds. Magnification: 1032x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

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