Difference between revisions of "Scanning electron microscope"
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== Description == | == Description == | ||
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SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.) | SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.) | ||
| − | == | + | ==Resources and Citations== |
| − | + | * Wikipedia: [https://en.wikipedia.org/wiki/Scanning_electron_microscope Scanning electron microscope] | |
* M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747 | * M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747 | ||
| − | + | * National Gallery of Art, Scientific Research: [https://www.nga.gov/conservation/glossary.html Glossary of Conservation Terminology] | |
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[[Category:Materials database]] | [[Category:Materials database]] | ||
Latest revision as of 11:35, 20 June 2023
Description
A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present.
Synonyms and Related Terms
SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.)
Resources and Citations
- Wikipedia: Scanning electron microscope
- M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747
- National Gallery of Art, Scientific Research: Glossary of Conservation Terminology