Difference between revisions of "Scanning electron microscope"
Jump to navigation
Jump to search
(username removed) |
|||
| (6 intermediate revisions by 3 users not shown) | |||
| Line 1: | Line 1: | ||
| − | |||
== Description == | == Description == | ||
| − | A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample characterize the elements that are present. | + | A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present. |
== Synonyms and Related Terms == | == Synonyms and Related Terms == | ||
| Line 8: | Line 7: | ||
SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.) | SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.) | ||
| − | == | + | ==Resources and Citations== |
| − | + | * Wikipedia: [https://en.wikipedia.org/wiki/Scanning_electron_microscope Scanning electron microscope] | |
| − | * | + | * M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747 |
| − | + | * National Gallery of Art, Scientific Research: [https://www.nga.gov/conservation/glossary.html Glossary of Conservation Terminology] | |
[[Category:Materials database]] | [[Category:Materials database]] | ||
Latest revision as of 11:35, 20 June 2023
Description
A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present.
Synonyms and Related Terms
SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.)
Resources and Citations
- Wikipedia: Scanning electron microscope
- M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747
- National Gallery of Art, Scientific Research: Glossary of Conservation Terminology