Difference between revisions of "Electron spectroscopy for chemical analysis"
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ESCA; X-ray photoelectron spectroscopy (XPS); Photoelektronenspektoskopie (PES) (Deut.); spectrométrie photoélectronique X (Fr.); | ESCA; X-ray photoelectron spectroscopy (XPS); Photoelektronenspektoskopie (PES) (Deut.); spectrométrie photoélectronique X (Fr.); | ||
| − | == | + | ==Resources and Citations== |
| − | * Wikipedia | + | * Wikipedia: http://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy (Accessed Feb. 10, 2006) |
[[Category:Materials database]] | [[Category:Materials database]] | ||
Latest revision as of 10:14, 1 August 2022
Description
An analytical method that uses a focused beam of x-ray photons to ionize inner core electrons in the sample. These electrons are ejected and measured to identify the elements in the surface of the sample. Information is also obtained on the chemical bonding state of each element. Electron spectroscopy for chemical analysis (ESCA) is a surface analysis technique in which only the upper monolayers of the surface are analyzed. The analysis area is approximately 1 square millimeter.
Synonyms and Related Terms
ESCA; X-ray photoelectron spectroscopy (XPS); Photoelektronenspektoskopie (PES) (Deut.); spectrométrie photoélectronique X (Fr.);
Resources and Citations
- Wikipedia: http://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy (Accessed Feb. 10, 2006)