Difference between revisions of "File:2 03 5 NoirDeVigna EDS Spectrum.jpg"
(EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): carbon, oxygen, calcium. Minor (1-10%): phosphorus. Trace (< 1%): magnesium, sodium, silicon. Area X-ray counts collected: 1,...) |
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Line 6: | Line 6: | ||
Trace (< 1%): magnesium, sodium, silicon. | Trace (< 1%): magnesium, sodium, silicon. | ||
− | Area X-ray counts collected: 1, | + | Area X-ray counts collected: 1,012,182. |
− | Live Time: | + | Live Time: 19.7 seconds. |
− | Magnification: | + | Magnification: 743x. |
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. | Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. |
Latest revision as of 13:25, 31 January 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): carbon, oxygen, calcium. Minor (1-10%): phosphorus. Trace (< 1%): magnesium, sodium, silicon.
Area X-ray counts collected: 1,012,182. Live Time: 19.7 seconds. Magnification: 743x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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current | 13:24, 31 January 2017 | 1,460 × 441 (70 KB) | MKullman (talk | contribs) | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): carbon, oxygen, calcium. Minor (1-10%): phosphorus. Trace (< 1%): magnesium, sodium, silicon. Area X-ray counts collected: 1,... |
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