Difference between revisions of "File:3 02 3 Orpiment1916 EDS Spectrum.jpg"
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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) | ||
| − | Elements Identified | + | Elements Identified |
Major (> 10%): oxygen, carbon, arsenic. | Major (> 10%): oxygen, carbon, arsenic. | ||
Minor (1-10%): sulfer, silicon, calcium. | Minor (1-10%): sulfer, silicon, calcium. | ||
Trace (< 1%):NA. | Trace (< 1%):NA. | ||
| − | Area X-ray counts collected:1,007,569. | + | Area X-ray counts collected: 1,007,569. |
| − | Live Time:12. | + | Live Time: 12.2 seconds. |
| − | Magnification:502x. | + | Magnification: 502x. |
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. | Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. | ||
Latest revision as of 12:43, 29 June 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): oxygen, carbon, arsenic. Minor (1-10%): sulfer, silicon, calcium. Trace (< 1%):NA.
Area X-ray counts collected: 1,007,569. Live Time: 12.2 seconds. Magnification: 502x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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