Difference between revisions of "File:3 04 23 YellowOchreLight EDS Spectrum.jpg"
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− | + | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) | |
+ | |||
+ | Elements Identified | ||
+ | Major (> 10%): carbon, oxygen, calcium. | ||
+ | Minor (1-10%): sulfur, iron, silicon. | ||
+ | Trace (< 1%): aluminum, magnesium, potassium. | ||
+ | |||
+ | Area X-ray counts collected: 1,008,309. | ||
+ | Live Time: 13.7 seconds. | ||
+ | Magnification: 817x. | ||
+ | Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. |
Latest revision as of 10:29, 30 June 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): carbon, oxygen, calcium. Minor (1-10%): sulfur, iron, silicon. Trace (< 1%): aluminum, magnesium, potassium.
Area X-ray counts collected: 1,008,309. Live Time: 13.7 seconds. Magnification: 817x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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