Difference between revisions of "File:3 15 8 ArcheleYellow EDS Spectrum.jpg"
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| − | + | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) | |
| + | |||
| + | Elements Identified | ||
| + | Major (> 10%): carbon, lead, oxygen. | ||
| + | Minor (1-10%): chromium. | ||
| + | Trace (< 1%): aluminum. | ||
| + | |||
| + | Area X-ray counts collected: 1,014,978. | ||
| + | Live Time: 27.3 seconds. | ||
| + | Magnification: 1589x. | ||
| + | Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. | ||
Latest revision as of 13:42, 16 August 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): carbon, lead, oxygen. Minor (1-10%): chromium. Trace (< 1%): aluminum.
Area X-ray counts collected: 1,014,978. Live Time: 27.3 seconds. Magnification: 1589x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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