Difference between revisions of "Scanning electron microscope"
Jump to navigation
Jump to search
| Line 10: | Line 10: | ||
* M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747 | * M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747 | ||
| − | + | * National Gallery of Art, Scientific Research: [https://www.nga.gov/conservation/glossary.html Glossary of Conservation Terminology] | |
| − | * | ||
| − | |||
| − | |||
[[Category:Materials database]] | [[Category:Materials database]] | ||
Revision as of 11:34, 20 June 2023
Description
A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present.
Synonyms and Related Terms
SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.)
Resources and Citations
- M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747
- National Gallery of Art, Scientific Research: Glossary of Conservation Terminology