Difference between revisions of "File:ChartImageLarge 2373.jpg"

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SEM at 600x (MFA)
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Analyzed on JEOL JSM 6460LV electron beam microprobe with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software.  Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV in low vacuum chamber (35 Pascals).  Images were collected using JEOL backscattered electron imaging in shadow mode.

Latest revision as of 09:32, 4 May 2013

SEM at 600x (MFA)

Analyzed on JEOL JSM 6460LV electron beam microprobe with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV in low vacuum chamber (35 Pascals). Images were collected using JEOL backscattered electron imaging in shadow mode.

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