Difference between revisions of "File:3 10 20A CadmiumLight EDS Spectrum.jpg"
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Trace (< 1%): NA. | Trace (< 1%): NA. | ||
− | Area X-ray counts collected: | + | Area X-ray counts collected: 1,012,853. |
− | Live Time: | + | Live Time: 17.3 seconds. |
− | Magnification: | + | Magnification: 2608x. |
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. | Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength. |
Latest revision as of 15:40, 15 August 2017
EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): carbon, barium, oxygen, cadmium. Minor (1-10%): sulfur, zinc. Trace (< 1%): NA.
Area X-ray counts collected: 1,012,853. Live Time: 17.3 seconds. Magnification: 2608x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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