ChartImageLarge 2395.jpg
Revision as of 09:32, 4 May 2013 by (username removed)
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EDS (MFA)
Analyzed on JEOL JSM 6460LV scanning electron microscope with INCA x-sight energy-dispersive X-Ray spectrometry (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV in low vacuum chamber (35 Pascals). The resolution of the INCA detector is 133 eV at 5.9 keV.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 09:28, 4 May 2013 | | 640 × 201 (17 KB) | Maintenance script (talk) | Importing image file |
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