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Revision as of 09:32, 4 May 2013 by (username removed)
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SEM at 600x (MFA)
Analyzed on JEOL JSM 6460LV electron beam microprobe with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV in low vacuum chamber (35 Pascals). Images were collected using JEOL backscattered electron imaging in shadow mode.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 09:28, 4 May 2013 | | 480 × 480 (30 KB) | Maintenance script (talk) | Importing image file |
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