3 03 24 RawSienna EDS Spectrum.jpg
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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): carbon, oxygen, iron. Minor (1-10%): silicon. Trace (< 1%): aluminum, phosphorus.
Area X-ray counts collected: 1,008,467. Live Time: 12.3 seconds. Magnification: 1757x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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| current | 16:47, 29 June 2017 | | 1,688 × 442 (70 KB) | AJones (talk | contribs) | File uploaded with MsUpload |
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