Scanning electron microscope

From CAMEO
Revision as of 11:35, 20 June 2023 by MDerrick (talk | contribs) (→‎Resources and Citations)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search

Description

A microscope that uses a scanning beam of electrons to magnify images as much as 50,000 times. First sold commercially in 1965, the scanning electron microscope (SEM) has a finely focused electron beam that interacts with the sample's surface to provide images and analysis. Electrons that are ejected from the sample, called secondary electrons, are collected and translated into a picture of the sample's surface. X-rays emitted from the sample permit by energy dispersive analysis to characterize and map the concentration of elements that are present.

Synonyms and Related Terms

SEM; microscope électronique à balayage (Fr.); MEB (Fr;); Rasterelektronenmicroscop (Deut.); microscopia electronica de varrimento (Port.)

Resources and Citations

  • Wikipedia: Scanning electron microscope
  • M. Schreiner, M. Melcher, K. Uhlir, Scanning electron microscopy and energy dispersive analysis: applications in the field of cultural heritage, Analytical and Bioanalytical Chemistry (February 2007) Vol 387, 3, pp 737-747
  • National Gallery of Art, Scientific Research: Glossary of Conservation Terminology

Retrieved from "https://cameo.mfa.org/index.php?title=Scanning_electron_microscope&oldid=95975"