XRF spectrum of tin.jpg

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XRF spectrum of tin analyzed at the MFA, Boston Scientific Lab using a Bruker X-ray fluorescence spectrometer using Artax software with an acquisition time of 120 seconds at 40 kV and 700 microamps.

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Date/TimeThumbnailDimensionsUserComment
current19:22, 15 August 2024Thumbnail for version as of 19:22, 15 August 2024960 × 580 (52 KB)MAdachi (talk | contribs)
11:38, 13 August 2024Thumbnail for version as of 11:38, 13 August 2024960 × 720 (55 KB)MDerrick (talk | contribs)

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