1 01 12 PlasterParis SEM 100um.jpg
Revision as of 13:43, 4 January 2017 by MKullman (talk | contribs) (SEM image with 100µm measurement bar (approximate to 500x magnification) (LC) Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum e...)
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SEM image with 100µm measurement bar (approximate to 500x magnification) (LC) Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascal) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 15 kV Image is compressed from an original 854 KB TIF file.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 13:43, 4 January 2017 | | 1,024 × 943 (521 KB) | MKullman (talk | contribs) | SEM image with 100µm measurement bar (approximate to 500x magnification) (LC) Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum e... |
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