3 02 5 OrpimentCoarse EDS Spectrum.jpg
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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): arsenic, oxygen, carbon. Minor (1-10%): nitrogen, sulfur. Trace (< 1%): tin, silicon, aluminum.
Area X-ray counts collected: 1,005,413. Live Time: 7.9 seconds. Magnification: 780x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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