1 10 3 NoLabel EDS Spectrum.jpg
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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): oxygen, carbon, silicon, magnesium. Minor (1-10%): NA. Trace (< 1%): NA.
Area X-ray counts collected: 1,047,913. Live Time: 42.7 seconds. Magnification: 488x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 13:20, 12 January 2017 | | 1,688 × 442 (68 KB) | MKullman (talk | contribs) | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): oxygen, carbon, silicon, magnesium. Minor (1-10%): NA. Trace (< 1%): NA. Area X-ray counts collected: 1,047,913. Live Time: 4... |
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