3 02 3 Orpiment1916 EDS Spectrum.jpg
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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified
Major (> 10%): oxygen, carbon, arsenic
Minor (1-10%): sulfer, silicon, calcium
Trace (< 1%):NA
Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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| current | 12:23, 29 June 2017 | | 1,688 × 442 (73 KB) | AJones (talk | contribs) | File uploaded with MsUpload |
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