PLM Wheat Starch Grains Reference XPL 400x.jpg

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Photomicrograph of wheat starch reference, XPL at 400X. Note the low birefringence with first-order grays and extinction crosses (sometimes distorted). Examined with a Nikon NiU upright polarizing light microscope, image captured with DSRi1 Pixel-shifting camera and Nikon Elements Basic Research software. Colonial Williamsburg Foundation, Materials Analysis Laboratory. Sample from Colonial Williamsburg Foundation, Objects Conservation Laboratory.

Photo credit: Kirsten Moffitt, Colonial Williamsburg Foundation

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