1 01 14 FinePlasterersLime SEM 100um.jpg

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SEM image with 100µm measurement bar (approximate to 500x magnification) (LC) Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. Imaging was performed in a low vacuum (10 Pascal) environment and signal was collected using an FEI solid-state backscattered electron detector (BSED). Accelerating voltage: 15 kV. Image is compressed from an original 954 KB TIF file.

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current09:13, 5 January 2017Thumbnail for version as of 09:13, 5 January 20171,024 × 943 (544 KB)MKullman (talk | contribs)SEM image with 100µm measurement bar (approximate to 500x magnification) (LC) Imaged with FEI Quanta 600 scanning electron microscope (SEM) and xT microscope Server user interface. Pigment sample was applied to carbon tape and mounted onto aluminum e...

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