Difference between revisions of "File:3 09 15 YellowLake EDS Spectrum.jpg"

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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
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Elements Identified
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Major (> 10%): carbon, oxygen.
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Minor (1-10%): phosphorus, aluminum, sodium.
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Trace (< 1%): calcium, silicon, potassium, magnesium, sulfur.
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Area X-ray counts collected: 1,012,261.
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Live Time: 20.3 seconds.
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Magnification: 1215x.
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Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

Latest revision as of 17:50, 20 July 2017

EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)

Elements Identified Major (> 10%): carbon, oxygen. Minor (1-10%): phosphorus, aluminum, sodium. Trace (< 1%): calcium, silicon, potassium, magnesium, sulfur.

Area X-ray counts collected: 1,012,261. Live Time: 20.3 seconds. Magnification: 1215x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascals). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

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