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EDS (MFA)
Analyzed on JEOL JSM 6460LV electron beam microprobe with INCA x-sight energy-dispersive X-Ray fluorescence (EDS) and INCA platform software. Powdered sample was mounted on carbon tape then analyzed using electron beam energy of 20kV in low vacuum chamber (35 Pascals). The resolution of the INCA detector is 133 eV at 5.9 eV.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 10:28, 4 May 2013 | | 640 × 201 (17 KB) | Maintenance script (talk) | Importing image file |
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