Difference between revisions of "Auger electron spectroscopy"
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== Synonyms and Related Terms == | == Synonyms and Related Terms == | ||
| − | AES; SAM; scanning auger microscopy; Auger-Spektroskopie (Deut.); | + | AES; SAM; scanning auger microscopy; Auger-Spektroskopie (Deut.); spectrométrie d'électrons Auger (Fr.); |
[[Category:Materials database]] | [[Category:Materials database]] | ||
Latest revision as of 06:53, 24 July 2013
Description
An analytical instrument that measures the energies of secondary electrons (Auger electrons) ejected from a sample when it is subjected to an electron beam. Auger electron originate in the top 2 - 10 monolayers of the surface. The energy of the electron is characteristic of the parent atom and can thus be used to identify the composition of the atoms on the surface of the sample. Auger spectroscopy is a very sensitive surface analysis method.
Synonyms and Related Terms
AES; SAM; scanning auger microscopy; Auger-Spektroskopie (Deut.); spectrométrie d'électrons Auger (Fr.);