1 01 13 GessoBologna EDS Spectrum.jpg
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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)
Elements Identified Major (> 10%): oxygen, carbon, calcium Minor (1-10%): NA Trace (< 1%): silicon
Area X-ray counts collected: 1,016,168 Live Time: 37.8 seconds Magnification: 3884x Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
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| current | 14:24, 4 January 2017 | | 1,460 × 441 (60 KB) | MKullman (talk | contribs) | EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): oxygen, carbon, calcium Minor (1-10%): NA Trace (< 1%): silicon Area X-ray counts collected: 1,016,168 Live Time: 37.8 seconds... |
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