Difference between revisions of "Atomic force microscopy"
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AFM; Rasterkraftmikroskop (Deut.); microscope à force atomique (Fr.); | AFM; Rasterkraftmikroskop (Deut.); microscope à force atomique (Fr.); | ||
| − | == | + | == Sources Checked for Data in Record == |
* Richard S. Lewis, ''Hawley's Condensed Chemical Dictionary'', Van Nostrand Reinhold, New York, 10th ed., 1993 | * Richard S. Lewis, ''Hawley's Condensed Chemical Dictionary'', Van Nostrand Reinhold, New York, 10th ed., 1993 | ||
Revision as of 13:55, 29 April 2016
Description
A high magnification analysis method. Atomic force microscopy profiles a surface at the atomic level by scanning a probe slightly above the surface. The field variations due to the varying gap are measured and used to produce an image of the surface.
Synonyms and Related Terms
AFM; Rasterkraftmikroskop (Deut.); microscope à force atomique (Fr.);
Sources Checked for Data in Record
- Richard S. Lewis, Hawley's Condensed Chemical Dictionary, Van Nostrand Reinhold, New York, 10th ed., 1993