Atomic force microscopy
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Description
A high magnification analysis method. Atomic force microscopy profiles a surface at the atomic level by scanning a probe slightly above the surface. The field variations due to the varying gap are measured and used to produce an image of the surface.
Synonyms and Related Terms
AFM; Rasterkraftmikroskop (Deut.); microscope à force atomique (Fr.);
Resources and Citations
- Richard S. Lewis, Hawley's Condensed Chemical Dictionary, Van Nostrand Reinhold, New York, 10th ed., 1993