Difference between revisions of "Atomic force microscopy"
Jump to navigation
Jump to search
(username removed) |
(username removed) |
||
| Line 5: | Line 5: | ||
== Synonyms and Related Terms == | == Synonyms and Related Terms == | ||
| − | AFM; Rasterkraftmikroskop (Deut.); microscope | + | AFM; Rasterkraftmikroskop (Deut.); microscope à force atomique (Fr.); |
== Authority == | == Authority == | ||
| − | * | + | * Richard S. Lewis, ''Hawley's Condensed Chemical Dictionary'', Van Nostrand Reinhold, New York, 10th ed., 1993 |
[[Category:Materials database]] | [[Category:Materials database]] | ||
Revision as of 07:53, 24 July 2013
Description
A high magnification analysis method. Atomic force microscopy profiles a surface at the atomic level by scanning a probe slightly above the surface. The field variations due to the varying gap are measured and used to produce an image of the surface.
Synonyms and Related Terms
AFM; Rasterkraftmikroskop (Deut.); microscope à force atomique (Fr.);
Authority
- Richard S. Lewis, Hawley's Condensed Chemical Dictionary, Van Nostrand Reinhold, New York, 10th ed., 1993